{"product_id":"9780367446802","title":"Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation","description":"\u003cp\u003eNeutron and synchrotron X-ray diffraction have emerged as leading techniques for stress analysis. This book presents an overview of the principles of these techniques and examples of their applications to a range of materials and engineering problems. It contains 20 papers from leading international experts in residual stress analysis covering the\u003c\/p\u003e","brand":"CRC Press","offers":[{"title":"Default Title","offer_id":49203879968995,"sku":"00000_00000_00000_00000","price":91.99,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0764\/3758\/6147\/files\/9780367446802-1.jpg?v=1788485457","url":"https:\/\/usa.kinokuniya.com\/ja\/products\/9780367446802","provider":"Books Kinokuniya USA","version":"1.0","type":"link"}