{"product_id":"9780387292601","title":"Nanoscale Thin Film Analysis : Fundamentals and Techniques (2007. XX, 380 p. w. 100 figs.)","description":"\u003cp\u003eIt describes characterization techniques to quantify the structure, composition and depth distribution of materials with the use of energetic particles and photons.The book describes the fundamentals of materials characterization from the standpoint of the incident photons or particles which interrogate nanoscale structures.\u003c\/p\u003e","brand":"springer","offers":[{"title":"Default Title","offer_id":49108435796195,"sku":"00000_00000_00000_00000","price":109.99,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0764\/3758\/6147\/files\/9780387292601-1.jpg?v=1788336856","url":"https:\/\/usa.kinokuniya.com\/products\/9780387292601","provider":"Books Kinokuniya USA","version":"1.0","type":"link"}