{"product_id":"9780470016084","title":"Spectroscopic Ellipsometry : Principles and Applications","description":"\u003cp\u003eEllipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE).\u003c\/p\u003e","brand":"John Wiley \u0026 Sons Inc","offers":[{"title":"Default Title","offer_id":49108444709091,"sku":"00000_00000_00000_00000","price":267.95,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0764\/3758\/6147\/files\/9780470016084-1.jpg?v=1788340973","url":"https:\/\/usa.kinokuniya.com\/products\/9780470016084","provider":"Books Kinokuniya USA","version":"1.0","type":"link"}