{"product_id":"9780815378822","title":"Thermal-Aware Testing of Digital VLSI Circuits and Systems","description":"\u003cp\u003eThis book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.\u003c\/p\u003e","brand":"CRC Press Inc","offers":[{"title":"Default Title","offer_id":49114805993699,"sku":"00000_00000_00000_00000","price":110.99,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0764\/3758\/6147\/files\/9780815378822-1.jpg?v=1788355728","url":"https:\/\/usa.kinokuniya.com\/products\/9780815378822","provider":"Books Kinokuniya USA","version":"1.0","type":"link"}