{"product_id":"9781681740249","title":"An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (Iop Concise Physics)","description":"\u003cp\u003eHighlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.\u003c\/p\u003e","brand":"Morgan \u0026 Claypool Publishers","offers":[{"title":"Default Title","offer_id":49180298510563,"sku":"00000_00000_00000_00000","price":35.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0764\/3758\/6147\/files\/9781681740249-1.jpg?v=1788405196","url":"https:\/\/usa.kinokuniya.com\/products\/9781681740249","provider":"Books Kinokuniya USA","version":"1.0","type":"link"}