Back

Zoom Roll over image to zoom in

Scanning Microscopy for Nanotechnology : Techniques and Applications

Zhou, Weilie (EDT)/ Wang, Zhong-Lin (EDT)
249.99 USD
Member Price
225.00
English

Product Description

Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation.

... Read Full Text

Available to Order

Usually dispatches within 8-10 business days

While every attempt has been made to ensure stock availability, occasionally we may run out of stock at our stores.

Free domestic shipping on orders over 50.00USD

Discount is applied at checkout.

Recently Viewed Items

Related Products